Institute of Materials Science and Nanotechnology
Nanoscale Devices and Imaging Group
MSN510 Imaging Techniques in Materials Science and Nanotechnology
Handouts - 1 (Mostly compiled from internet sources, and edited for educational use)
Handouts - 2 (Mostly compiled from internet sources, and edited for educational use)
Handouts - 3 Notes on fluorescence (compiled notes), Stains information
Handouts 4 - Confocal principle and methods (compiled notes)
Supplementary materials (as found on the web) : Notes on multiphoton and superresolution techniques
notes on STM and AFM
notes on electron microscopy (https://engineering.purdue.edu/MSE/Academics/Courses/MSE582/index.html)
local copies of some of the lecture notes (from nanohub https://nanohub.org/resources/3777)
additional EM notes from previous years:
www.fen.bilkent.edu.tr/~aykutlu/msn510/temdiffraction.pdf
www.fen.bilkent.edu.tr/~aykutlu/msn510/temcon.pdf
Electron microscopy online simulation tools: http://emaps.mrl.uiuc.edu/emaps.asp
MSN510 Imaging Techniques in Materials Science and Nanotechnology
UNAM Institute of Materials Science and Nanotechnology
Bilkent University, 06800 Bilkent Ankara
Course Information
This course intends to give an introduction to imaging methods in Materials Science and Nanotechnology. Topics covered will include general fundamental concepts in image formation in parallel imaging systems such as optical microscopes and TEM. Sequential imaging systems such as confocal microscopes, scanning probe and electron/ion beam microscopies will be covered. Course includes laboratory work on available equipment. Theoretical descriptions of imaging modes and methods will be accompanied by technical information about the microscopes. Sample preparation techniques will be also be included whenever possible. Theoretical understanding will aim correct interpretation of microscope data. Fundamental limits of techniques will be discussed in detail in order to give the student an understanding of what is possible and what is not readily achievable with the presented techniques.
Lecturer: Aykutlu Dâna
Office hours: Mon. 13:40-17:40
Teaching Assistants: TBA
Course Schedule: SU-01 Tue. 10:40-12:30, Fri. 9:40-10:30
Lab. Sessions to be organized
Prerequisites: There are no prerequisites for the course. However, an understanding of basic optics, basic mechanics, quantum physics and basic electromagnetics will be helpful.
Textbook: The course will be based on handouts, no required textbook is chosen.
Homework: A total of five homeworks, weekly or bi-weekly is planned. Late homeworks will not be accepted. (20%)
Exams: One midterm (20%) and one final exam (30%)
Laboratory: Laboratory sessions and demonstrations (20%)
Attendance: Required (10%)
Tentative Course syllabus
Week : 1
Introduction, Description of course Organization, Determination of Laboratory Groups Fundamental Concepts in Imaging Optical Microscopy: Geometric Optics and the Lens, the Eye, Telescopes, Microscopes
Week : 2
Wave picture of light, Interference , Diffraction, Numerical Aperture, Point spread function, Depth of Focus, Basic Fourier Optics, Concept of Modulation and Contrast Transfer Functions
Additional Information: Homework 1: Basic concepts in imaging, point spread function
Week : 3
Contrast Mechanisms in widefield optical microscopy: Bright field, Dark Field, DIC, Phase Contrast, Polarization, Staining
Additional Information: Laboratory 1: Demonstration of contrast mechanisms in optical light microscopy
Week : 4
Confocal microscopy. Sample scanning vs laser scanning: Role of abberations. Labeling. Dynamic techniques, Hyperspectral and Raman Imaging, structured illumination
Week : 5
Contemporary topics and advanced optical microscopy: Stochastic methods, PALM, 4PI, STED, RESOLFT
Additional Information: Laboratory 2: Confocal Raman and fluorescence Imaging Homework 2: Advanced techniques, deconvolution and stochastic reconstruction
Week : 6
Scanning Tunneling Microscopy: Theoretical Descrition of tip-sample tunneling. STM components. Feedback control. Speed. Stability and Drifts. Vacuum and Low temperature STM. Application examples, Scanning Tunneling Spectroscopy and Spectroscopic Imaging. Interpretation of STM data.
Week : 7
Atomic Force Microscopy: Basic Machinery, Deflection detection methods, control systems. Harmonic oscillator response. Contact mode AFM. Lateral Force Microscopy. Determination of spring constants
Midterm 1
Week : 8
Non-contact and Semi-contact AFM: Basic tip-sample interaction. Force-distance measurements. Spatial resolution. Frequency shifts. Dissipation. Phase contrast. Amplitude-distance scans. Force Modulation Microscopy
Additional Information: Laboratory 3: AFM Basics and Tapping mode Imaging. Homework 3: Force-Distance and Amplitude Distance simulations.
Week : 9
Tapping mode AFM: Multi-Frequency techniques. Advanced imaging.
Week : 10
Non-contact Imaging of long-range forces: Electrostatic force microscopy and Magnetic force microscopy. Kelvin Probe Microscopy.Tip-sample interaction models for electrostatic and magnetic imaging
Week : 11
Imaging in Fluids: Dissipation, Q-Control Futher SPM techniques: SHPM, SSETM etc.
Week : 12
Scanning Electron Microscopy : SEM Basics of electron optics, resolution in SEM. Contrast Mechanisms. Detectors. STEM. Sample preparation for the SEM,Analytical Methods in SEM
Additional Information: Laboratory 4: TEM imaging Demo
Week : 13
TEM Imaging: Theoretical Desciption of TEM image formation. Anatomy of the TEM. Sample preparation. Analytical Methods in TEM: EELS, EFTEM
Week : 14
Review and Final Exam